Customized On-Shore IC Solutions

Trusted Semiconductor Solutions' Known-Good-Die Testing

Trusted Semiconductor Solutions is proud to offer a unique known-good-die (KGD) testing process. Known-good-die (KGD) is tested and screened die that is proven to be of high quality so that it can be used in a variety of end applications. KGD is often delivered for use in multi-chip-modules (MCMs), flip-chip packaging, or system-in-package (SIP) parts.

The process of qualifying die can be challenging, because traditional IC test equipment is designed to test packaged parts. Trade-offs need to be made on how much testing is required at the wafer level versus die level, how much handling of die is acceptable, and how to most economically and reliably assure KGD is delivered.

Our KGD test approach supports all types of designs, including high-pin count, high-frequency devices. The process begins at the wafer level and completes with fully-qualified and screened KGD. The TSS team, along with our back-end manufacturing partners provide a proven, on-shore, ITAR-compliant method for delivering fully tested known-good-die.

Known-Good-Die Test Capabilities: