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Trusted Semiconductor Solutions' Design Services

Trusted Semiconductor Solutions’ has unique experience and expertise to analyze CMOS, SiGe, and SOI devices in the foundry technologies that we support. Our company has worked to translate scientist level radiation effects analysis into methods, processes, procedures and tools to enable “radiation engineering” for these complex circuits. Below are some of the elements weradiation use to analyze the SEU performance:

  • First principle models for CMOS, SOI, and SiGe

  • SPICE level charge deposition models

  • Circuit simulation methods for SEU

  • State of the Art 3D-TCAD for confirmation of critical device volume

  • Spheres method to calculate the ion-ion interactions

  • Circuit topology mitigation techniques

  • Analysis of the composite error rate for the integrated circuit

Our methodology has been applied to SiGe, CMOS, and SOI devices in the form of digital logic cells and custom circuit functions.

Copyright Trusted Semiconductor Solutions, Inc. 2006-2009